Polytypes of colourless and coloured single crystals of silicon carbide (SiC) developed on SiC substrates by chemical vapour deposition are studied making use of Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of your defect stacking faults, inclusions of defects as well https://www.facebook.com/permalink.php?story_fbid=pfbid0ww438oyjEcTfX4xX6WCkQF5vy17yCx8goi3oH5YDkinKfFGxbWMtjjaD7YsNT2eKl&id=61562415773754&__cft__[0]=AZX-QAR_vhBkIQn-CHh-qVrVh-ymnljhRn7R-P73MC_nPlGeMjnnVcKfwAEvBSElWyReFDgdGfaBcSpcbzAjhXGt0VgSnonh2-Sn7EAslXaDomawwoS-fOBcpNsz1qhfPyulei1EyrV9fPp46vN--t13J6MfE305voku70pu4oXlBKLuIpeJRsbHFczk72IvZfA7Z3DWbF39VtWGhkRqIUI-&__tn__=%2CO%2CP-R